抄録
Friction force microscopy (FFM) is a mode of atomic force microscopy (AFM) that quantifies both normal and horizontal forces against substrates. Recent improvement in its accuracy at nanonewton ranges and the possibility of combining AFM with fluorescence microscopy enabled the simultaneous characterization by FFM and fluorescence microscopy. This Tutorial describes the operation principle of the dual friction force/fluorescence microscopy setup and highlights its emerging applications in mechanochromic materials.